Surface Analysis with Scanning Electron Microscopy and X-ray Spectroscopy

  • Surface condition/condition assessment - in new condition and after use or reprocessing - scanning electron microscopy (SEM)
  • Homogeneity and removal of coatings
  • Material determination - energy dispersive X-ray spectroscopy (EDX)
  • Damage analysis
  • Recognition of markings and inscriptions (e.g. UDI - Unique Device Identification)
Contact
Ben Mead
Managing Director
Hohenstein Institute America